engleski

Nanostructured CeO2 thin films: a SAXS study of the interface between grains and pores

Nanostructured CeO_2 thin films were prepared by sol-gel method. The structure of films was analyzed by SAXS, because these films can be considered as two-phase systems, i.e. they contain nanosized grains(as one phase) and pores (as another). The scattering of the first of our samples, the preparation of which included autoclaving, showed the accordance with the Porod´s law. The scattering of the other, on the contrary, showed a specific deviation, which can be used for the analysis of the interface characteristics.

cerium dioxide; thin film; small-angle X-ray scattering; interface; nanostructured films; SAXS

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