engleski

Time Delay Extraction from Spectral Measurements of High-Speed Digital Cells

This paper describes the simulations performed in order to evaluate expected performance of digital cells processed in 0.5-um GaAs MESFET technology, before these cells are measured on-chip. For high-speed cells it is very hard and usually very expensive to determine the time delay using direct methods. Measurements in the time domain can be avoided with the use of a spectrum analyzer. Two different approaches are discussed: the ring oscillator and the cell with two delay paths. The ring oscillator gives more accurate results of the time delay measurements.

GaAs; SCFL; high-speed circuits; digital circuits

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