New Algorithm for Microstructural Information Determination from the Overlapping X-ray Diffraction Profiles (CROSBI ID 234736)
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Podaci o odgovornosti
Dekanić, Krešimir ; Skoko, Željko ; Lončarić, Sven
engleski
New Algorithm for Microstructural Information Determination from the Overlapping X-ray Diffraction Profiles
Knowledge about the microstructure is crucial in targeted synthesis of novel nanomaterials. The microstructural para- meters, crystallite size and crystallite strain play a major role in physical and chemical properties of the material. X-ray diffraction (XRD) is a very suitable method for this task, since it is non-destructive and it enables a very quick and pre- cise determination of these parameters. The main problem lies in the case where the two neighboring diffraction profi- les overlap each other. Here we present a new method for the separation of the overlapping profiles based on the diffe- rentiation of the profiles. Further, this method is appropriate for non- crystallographers working in the field of material science since it does not require any crystallographic experience and the full knowledge about the structure of the sam- ple investigated. The microstructural results obtained by the proposed method are very accurate.
Separation of the overlapping diffraction profiles ; differentiation ; Fourier transformation ; X-ray diffraction ; microstructure ; nanomaterials
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Povezanost rada
Fizika, Kemija, Računarstvo