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New Algorithm for Microstructural Information Determination from the Overlapping X-ray Diffraction Profiles (CROSBI ID 234736)

Prilog u časopisu | izvorni znanstveni rad | međunarodna recenzija

Dekanić, Krešimir ; Skoko, Željko ; Lončarić, Sven New Algorithm for Microstructural Information Determination from the Overlapping X-ray Diffraction Profiles // Acta chimica slovenica, 63 (2016), 874-880. doi: 10.17344/acsi.2016.2837

Podaci o odgovornosti

Dekanić, Krešimir ; Skoko, Željko ; Lončarić, Sven

engleski

New Algorithm for Microstructural Information Determination from the Overlapping X-ray Diffraction Profiles

Knowledge about the microstructure is crucial in targeted synthesis of novel nanomaterials. The microstructural para- meters, crystallite size and crystallite strain play a major role in physical and chemical properties of the material. X-ray diffraction (XRD) is a very suitable method for this task, since it is non-destructive and it enables a very quick and pre- cise determination of these parameters. The main problem lies in the case where the two neighboring diffraction profi- les overlap each other. Here we present a new method for the separation of the overlapping profiles based on the diffe- rentiation of the profiles. Further, this method is appropriate for non- crystallographers working in the field of material science since it does not require any crystallographic experience and the full knowledge about the structure of the sam- ple investigated. The microstructural results obtained by the proposed method are very accurate.

Separation of the overlapping diffraction profiles ; differentiation ; Fourier transformation ; X-ray diffraction ; microstructure ; nanomaterials

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Podaci o izdanju

63

2016.

874-880

objavljeno

1318-0207

10.17344/acsi.2016.2837

Povezanost rada

Fizika, Kemija, Računarstvo

Poveznice
Indeksiranost