Graphene buckles under stress: An x-ray standing wave and scanning tunneling microscopy study (CROSBI ID 211161)
Prilog u časopisu | izvorni znanstveni rad | međunarodna recenzija
Podaci o odgovornosti
Runte, Sven ; Lazić, Predrag ; Vo-Van, Chi ; Coraux, Johann ; Zegenhagen, Joerg ; Busse, Carsten
engleski
Graphene buckles under stress: An x-ray standing wave and scanning tunneling microscopy study
Graphene on Ir(111) is studied using scanning tunneling microscopy (STM) and x-ray standing waves (XSW). The graphene layer has a corrugated shape due to the moire pattern formed as a result of a spatially varying interaction strength between graphene and its substrate. The coherent fraction F-(111) determined in XSW allows us to determine the amplitude of this intrinsic corrugation when the incoherent contributions of wrinkles, step edges, graphene edges, and contaminations are taken into account. The corrugation is found to depend on the stress state of the carbon sheet. Using density functional theory (DFT) calculations, we show that graphene can compensate stress by increasing its corrugation rather than by a reduction of the C-C bond length.
epitaxial graphene ; photoelectron-spectroscopy ; ir(111) ; strain ; chemisorption ; intercalation ; iridium ; metals ; edges
nije evidentirano
nije evidentirano
nije evidentirano
nije evidentirano
nije evidentirano
nije evidentirano
Podaci o izdanju
89 (15)
2014.
155427
8
objavljeno
1098-0121
1550-235X
10.1103/PhysRevB.89.155427