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Bibliographic record number: 727753

Journal

Authors: Runte, Sven; Lazić, Predrag; Vo-Van, Chi; Coraux, Johann; Zegenhagen, Joerg; Busse, Carsten
Title: Graphene buckles under stress: An x-ray standing wave and scanning tunneling microscopy study
( Graphene buckles under stress: An x-ray standing wave and scanning tunneling microscopy study )
Source: Physical review. B, Condensed matter and materials physics (1098-0121) 89 (2014), 15;
Paper type: article
Keywords: epitaxial graphene ; photoelectron-spectroscopy ; ir(111) ; strain ; chemisorption ; intercalation ; iridium ; metals ; edges
( epitaxial graphene ; photoelectron-spectroscopy ; ir(111) ; strain ; chemisorption ; intercalation ; iridium ; metals ; edges )
Abstract:
Graphene on Ir(111) is studied using scanning tunneling microscopy (STM) and x-ray standing waves (XSW). The graphene layer has a corrugated shape due to the moire pattern formed as a result of a spatially varying interaction strength between graphene and its substrate. The coherent fraction F-(111) determined in XSW allows us to determine the amplitude of this intrinsic corrugation when the incoherent contributions of wrinkles, step edges, graphene edges, and contaminations are taken into account. The corrugation is found to depend on the stress state of the carbon sheet. Using density functional theory (DFT) calculations, we show that graphene can compensate stress by increasing its corrugation rather than by a reduction of the C-C bond length.
Project / theme: 098-0352828-2863
Original language: eng
Citation databases: Current Contents Connect (CCC)
Scopus
SCI-EXP, SSCI i/ili A&HCI
Science Citation Index Expanded (SCI-EXP) (sastavni dio Web of Science Core Collectiona)
Category: Znanstveni
Research fields:
Physics
URL: https://doi.org/10.1103/PhysRevB.89.155427
https://journals.aps.org/prb/abstract/10.1103/PhysRevB.89.155427
Broj citata:
Altmetric:
DOI: 10.1103/PhysRevB.89.155427
URL cjelovitog rada:
Google Scholar: Graphene buckles under stress: An x-ray standing wave and scanning tunneling microscopy study
Contrib. to CROSBI by: Damir Šokčević (Damir.Sokcevic@irb.hr), 6. Stu. 2014. u 15:07 sati



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