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Bibliographic record number: 939391

Journal

Authors: Feng, Jiandong; Deschout, Hendrik; Caneva, Sabina; Hofmann, Stephan; Lončarić, Ivor; Lazić, Predrag; Radenovic, Aleksandra
Title: Imaging of Optically Active Defects with Nanometer Resolution
( Imaging of Optically Active Defects with Nanometer Resolution )
Source: Nano Letters (1530-6984) 18 (2018), 3; 1739-1744
Paper type: article
Keywords: Super resolution microscopy, boron nitride monolayer, point defects, localization microscopy
( Super resolution microscopy, boron nitride monolayer, point defects, localization microscopy )
Abstract:
Point defects significantly influence the optical and electrical properties of solid-state materials due to their interactions with charge carriers, which reduce the band-to-band optical transition energy. There has been a demand for developing direct optical imaging methods that would allow in situ characterization of individual defects with nanometer resolution. Here, we demonstrate the localization and quantitative counting of individual optically active defects in monolayer hexagonal boron nitride using single molecule localization microscopy. By exploiting the blinking behavior of defect emitters to temporally isolate multiple emitters within one diffraction limited region, we could resolve two defect emitters with a point-to-point distance down to ten nanometers. The results and conclusion presented in this work add unprecedented dimensions toward future applications of defects in quantum information processing and biological imaging.
Project / theme: EK-H2020-692194
Original language: eng
Citation databases: Current Contents Connect (CCC)
MEDLINE
Scopus
Science Citation Index Expanded (SCI-EXP) (sastavni dio Web of Science Core Collectiona)
Category: Znanstveni
Research fields:
Physics
URL: https://pubs.acs.org/doi/full/10.1021/acs.nanolett.7b04819
Broj citata:
Altmetric:
DOI: 10.1021/acs.nanolett.7b04819
URL cjelovitog rada:
Google Scholar: Imaging of Optically Active Defects with Nanometer Resolution
Contrib. to CROSBI by: Ivor Lončarić (Ivor.Loncaric@irb.hr), 23. Svi. 2018. u 09:11 sati



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