Energy straggling induced errors in heavy-ion PIXE analysis (CROSBI ID 81311)
Prilog u časopisu | izvorni znanstveni rad | međunarodna recenzija
Podaci o odgovornosti
Tadić, Tonči ; Mokuno, Y. ; Horino, Y. ; Fujii, K. ; Jakšić, Milko
engleski
Energy straggling induced errors in heavy-ion PIXE analysis
Numerical calculations of the heavy-ion energy straggling influence on quantitative heavy-ion PIXE analysis are presented. Heavy ion electronic straggling was calculated using semi-empirical model of Yang. Since heavy ion nuclear straggling is significant and in some cases larger than the electronic one, it has also been included into the calculations. Energy variations of K ionization cross sections were calculated using the ECPSSRmodel. Results for heavy ions are compared with those for protons, for the case of heavy element analysis in a light matrix and for the case of light element analysis in a heavy matrix. Implications on the quantitative heavy ion PIXE analysis are discussed.
Heavy-ion. Pixe. Straggling. Ecpssr. K lines
nije evidentirano
nije evidentirano
nije evidentirano
nije evidentirano
nije evidentirano
nije evidentirano
Podaci o izdanju
138
1998.
179-183
objavljeno
0168-583X
Povezanost rada
Fizika